Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations

Analysis and Design of Resilient VLSI Circuits Mitigating Soft Errors and Process Variations

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Bibliographic Details
Main Author: Garg, Rajesh
Corporate Author: SpringerLink (Online service)
Other Authors: Khatri, Sunil P
Format: Electronic Kit Book
Language:English
Published: Boston, MA Springer-Verlag US 2010
Subjects:
Engineering
Computer aided design
Systems engineering
Circuits and Systems
Computer-Aided Engineering (CAD, CAE) and Design
Online Access:http://dx.doi.org/10.1007/978-1-4419-0931-2

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