Accelerated testing statistical modes, test plans, and data analysis
| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York
John Wiley and Sons
1990
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| Series: | Wiley series in probability and mathematical statistics : Applied probability and statistics
|
| Subjects: |
ΒΚΠ - Πατρα: BSC
| Call Number: |
519.5 NEL |
|---|---|
| Copy 1 | Available |
| Copy 2 | Available |
| Copy 3 | Available |