Accelerated testing statistical modes, test plans, and data analysis

Bibliographic Details
Main Author: Nelson, Wayne 1936- (Author)
Format: Book
Language:English
Published: New York John Wiley and Sons 1990
Series:Wiley series in probability and mathematical statistics : Applied probability and statistics
Subjects:

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 519.5 NEL
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