Accelerated testing statistical modes, test plans, and data analysis
Κύριος συγγραφέας: | Nelson, Wayne 1936- (Συγγραφέας) |
---|---|
Μορφή: | Βιβλίο |
Γλώσσα: | English |
Έκδοση: |
New York
John Wiley and Sons
1990
|
Σειρά: | Wiley series in probability and mathematical statistics : Applied probability and statistics
|
Θέματα: |
Παρόμοια τεκμήρια
-
Hierarchical linear models applications and data analysis methods
ανά: Bryk, Anthony S.
Έκδοση: (1992) -
Optimal reliability modeling principles and applications
ανά: Kuo, Way, κ.ά.
Έκδοση: (2003) -
Statistical tests for mixed linear models
ανά: Khuri, Andre I.
Έκδοση: (1998) -
Statistical analysis of reliability and life-testing models
ανά: Bain, Lee J. 1939-
Έκδοση: (1991) -
Working with sensitizing concepts analytical field research
ανά: Hoonaard, Will C. Van den
Έκδοση: (1997)