Accelerated testing statistical modes, test plans, and data analysis
| Κύριος συγγραφέας: | Nelson, Wayne 1936- (Συγγραφέας) |
|---|---|
| Μορφή: | Βιβλίο |
| Γλώσσα: | English |
| Έκδοση: |
New York
John Wiley and Sons
1990
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| Σειρά: | Wiley series in probability and mathematical statistics : Applied probability and statistics
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| Θέματα: |
Παρόμοια τεκμήρια
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