Nondestructive evaluation of semiconductor materials and devices /

• Corporate Author: NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices Villa Tuscolano, Italy
• Other Authors: Zemel, Jay N. (επιμελητής.)
• Format: Conference Proceeding Book
• Language: English
• Published: New York : Plenum Press, 1979.
• Series: NATO ASI series. Physics 46.
• Subjects: Ημιαγωγοί