An artificial intelligence approach to test generation

• Main Author: Singh, Narinder (Author)
• Format: Book
• Language: English
• Published: Boston Kluwer Academic Publishers c1987
• Series: Kluwer International Series in Engineering and Computer Science
• Subjects: INTEGRATED CIRCUITS; VLSI; Τεχνητή νοημοσύνη
• Item Description: Βιβλιογραφία : σσ. 189-193
• Physical Description: x,193p. fig.
• ISBN: 0 89838 185 1