|
|
|
|
| LEADER |
01188cam a22002773u 4500 |
| 001 |
10101922 |
| 003 |
upatras |
| 005 |
20210117203822.0 |
| 008 |
991022s eng |
| 020 |
|
|
|a 0 89838 185 1
|
| 040 |
|
|
|a Βιβλιοθήκη ΕΑΙΤΥ
|c Βιβλιοθήκη ΕΑΙΤΥ
|
| 041 |
0 |
|
|a eng
|
| 245 |
1 |
0 |
|a An artificial intelligence approach to test generation
|
| 260 |
|
|
|a Boston
|b Kluwer Academic Publishers
|c c1987
|
| 300 |
|
|
|a x,193p.
|b fig.
|
| 490 |
0 |
|
|a Kluwer International Series in Engineering and Computer Science
|
| 500 |
|
|
|a Βιβλιογραφία : σσ. 189-193
|
| 650 |
|
4 |
|a INTEGRATED CIRCUITS
|9 24300
|
| 650 |
|
4 |
|a VLSI
|9 24366
|
| 650 |
|
4 |
|9 84642
|a Τεχνητή νοημοσύνη
|
| 700 |
1 |
|
|a Singh, Narinder
|4 aut
|9 116157
|
| 760 |
0 |
|
|a Kluwer International Series in Engineering and Computer Science
|
| 852 |
|
|
|a GR-PaULI
|b ΠΑΤΡΑ
|b ΤΜΗΥΠ
|h 621.395 SIN
|t 1
|
| 942 |
|
|
|2 ddc
|
| 999 |
|
|
|c 83099
|d 83099
|
| 952 |
|
|
|0 0
|1 0
|2 ddc
|4 0
|6 621_395000000000000_SIN
|7 0
|8 NFIC
|9 126753
|a LISP
|b LISP
|c ALFf
|d 2016-04-24
|l 0
|o 621.395 SIN
|p 025000281868
|r 2016-04-24
|t 1
|w 2016-04-24
|y BK15
|x Μεταφορά από Τμ. Μηχανικών ΗΥ & Πληροφορικής
|
