An artificial intelligence approach to test generation

An artificial intelligence approach to test generation

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας:	Singh, Narinder (Συγγραφέας)
Μορφή:	Βιβλίο
Γλώσσα:	English
Έκδοση:	Boston Kluwer Academic Publishers c1987
Σειρά:	Kluwer International Series in Engineering and Computer Science
Θέματα:	INTEGRATED CIRCUITS VLSI Τεχνητή νοημοσύνη

Παρόμοια τεκμήρια

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