An artificial intelligence approach to test generation

An artificial intelligence approach to test generation

Bibliographic Details
Main Author:	Singh, Narinder (Author)
Format:	Book
Language:	English
Published:	Boston Kluwer Academic Publishers c1987
Series:	Kluwer International Series in Engineering and Computer Science
Subjects:	INTEGRATED CIRCUITS VLSI Τεχνητή νοημοσύνη

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