International Test Conference Washington. (1986). Testings impact on design and technology: International test conference proceedings 1986 Washington DC, september 8,9,10,11,1986. IEEE Computer Society Press.
Chicago Style (17th ed.) CitationInternational Test Conference Washington. Testings Impact on Design and Technology: International Test Conference Proceedings 1986 Washington DC, September 8,9,10,11,1986. Washington DC: IEEE Computer Society Press, 1986.
MLA (8th ed.) CitationInternational Test Conference Washington. Testings Impact on Design and Technology: International Test Conference Proceedings 1986 Washington DC, September 8,9,10,11,1986. IEEE Computer Society Press, 1986.
Warning: These citations may not always be 100% accurate.
