Testings impact on design and technology International test conference proceedings 1986 Washington DC, september 8,9,10,11,1986

• Corporate Author: International Test Conference Washington
• Format: Conference Proceeding Book
• Language: English
• Published: Washington DC IEEE Computer Society Press c1986
• Subjects: IEEE; PROCEEDINGS; Δοκιμές; ΠΡΑΚΤΙΚΑ ΣΥΝΕΔΡΙΩΝ
• Item Description: Περιέχει βιβλιογραφικές αναφορές
• Physical Description: xxx, 1009p. fig.
• ISBN: 0 8186 4726 2