Testings impact on design and technology International test conference proceedings 1986 Washington DC, september 8,9,10,11,1986

Testings impact on design and technology International test conference proceedings 1986 Washington DC, september 8,9,10,11,1986

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή:	International Test Conference Washington
Μορφή:	Πρακτικό Συνεδρίου Βιβλίο
Γλώσσα:	English
Έκδοση:	Washington DC IEEE Computer Society Press c1986
Θέματα:	IEEE PROCEEDINGS Δοκιμές ΠΡΑΚΤΙΚΑ ΣΥΝΕΔΡΙΩΝ

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