International Test Conference Washington. (1987). Integration of test with design and manufacturing: International test conference proceedings 1987 Washington DC, september 1,2,3 1987. IEEE Computer Society Press.
Chicago Style (17th ed.) CitationInternational Test Conference Washington. Integration of Test with Design and Manufacturing: International Test Conference Proceedings 1987 Washington DC, September 1,2,3 1987. Washington DC: IEEE Computer Society Press, 1987.
MLA (8th ed.) CitationInternational Test Conference Washington. Integration of Test with Design and Manufacturing: International Test Conference Proceedings 1987 Washington DC, September 1,2,3 1987. IEEE Computer Society Press, 1987.
Warning: These citations may not always be 100% accurate.
