Integration of test with design and manufacturing International test conference proceedings 1987 Washington DC, september 1,2,3 1987

Bibliographic Details
Corporate Author: International Test Conference Washington
Format: Conference Proceeding Book
Language:English
Published: Washington DC IEEE Computer Society Press c1987
Subjects:
Description
Item Description:Περιέχει βιβλιογραφικές αναφορές
Physical Description:xxxi, 1151p. fig.
ISBN:0 8186 0798 x