Integration of test with design and manufacturing International test conference proceedings 1987 Washington DC, september 1,2,3 1987
Corporate Author: | |
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Format: | Conference Proceeding Book |
Language: | English |
Published: |
Washington DC
IEEE Computer Society Press
c1987
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Subjects: |
Μηχανικών Η/Υ και Πληροφορικής: Unknown
Call Number: |
621.381 548 |
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Copy 1 | Available |