Integration of test with design and manufacturing International test conference proceedings 1987 Washington DC, september 1,2,3 1987

Bibliographic Details
Corporate Author: International Test Conference Washington
Format: Conference Proceeding Book
Language:English
Published: Washington DC IEEE Computer Society Press c1987
Subjects:

Μηχανικών Η/Υ και Πληροφορικής: Unknown

Holdings details from Μηχανικών Η/Υ και Πληροφορικής: Unknown
Call Number: 621.381 548
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