The state of the Art:from device testing to reconfigurable systems. FTC/3 International symposium on Fault-Tolerant Computing Palo Alto, CA, June 20-23, 1973

• Format: Book
• Language: English
• Published: New York IEEE Computer Society Press c1973
• Subjects: FAULT > TOLERANT COMPUTING; FTCS; IEEE; PROCEEDINGS
• Item Description: Περιέχει βιβλιογραφικές αναφορές
• Physical Description: v, 182p. fig.