APA (7th ed.) Citation

Bardell, P. H., McAnney, W. H., & Savir, J. (1987). Built-in test for VLSI: Preudorandom techniques. John Wiley & Sons.

Chicago Style (17th ed.) Citation

Bardell, Paul H., William H. McAnney, and Jacob Savir. Built-in Test for VLSI: Preudorandom Techniques. New York: John Wiley & Sons, 1987.

MLA (8th ed.) Citation

Bardell, Paul H., et al. Built-in Test for VLSI: Preudorandom Techniques. John Wiley & Sons, 1987.