International Test Conference Washington & IEEE Computer Society. (1990). The changing philosophy of test: International test conference proceedings 1990 Washington, DC, September 10-14, 1990. IEEE Computer Society Press.
Chicago Style (17th ed.) CitationInternational Test Conference Washington and IEEE Computer Society. The Changing Philosophy of Test: International Test Conference Proceedings 1990 Washington, DC, September 10-14, 1990. Los Alamitos: IEEE Computer Society Press, 1990.
MLA (8th ed.) CitationInternational Test Conference Washington and IEEE Computer Society. The Changing Philosophy of Test: International Test Conference Proceedings 1990 Washington, DC, September 10-14, 1990. IEEE Computer Society Press, 1990.
Warning: These citations may not always be 100% accurate.
