The changing philosophy of test International test conference proceedings 1990 Washington, DC, September 10-14, 1990
| Corporate Authors: | , |
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| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Los Alamitos
IEEE Computer Society Press
c1990
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| Subjects: |
| Item Description: | Περιέχει βιβλιογραφικές αναφορές |
|---|---|
| Physical Description: | xvi, 1083p. fig. |
| ISBN: | 0 8186 2064 1 |
