The changing philosophy of test International test conference proceedings 1990 Washington, DC, September 10-14, 1990

The changing philosophy of test International test conference proceedings 1990 Washington, DC, September 10-14, 1990

Bibliographic Details
Corporate Authors:	International Test Conference Washington, IEEE Computer Society
Format:	Conference Proceeding Book
Language:	English
Published:	Los Alamitos IEEE Computer Society Press c1990
Subjects:	IEEE PROCEEDINGS Δοκιμές ΠΡΑΚΤΙΚΑ ΣΥΝΕΔΡΙΩΝ

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