The changing philosophy of test International test conference proceedings 1990 Washington, DC, September 10-14, 1990

Bibliographic Details
Corporate Authors: International Test Conference Washington, IEEE Computer Society
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos IEEE Computer Society Press c1990
Subjects:

Μηχανικών Η/Υ και Πληροφορικής: Unknown

Holdings details from Μηχανικών Η/Υ και Πληροφορικής: Unknown
Call Number: 621.381 548
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