Ambler, A. P., Dear, I. D., Dick, J. H., & Dislis, C. (1995). Test Economis and design for testability for electronic circuits and systems. Ellis Horwood Ltd.
Chicago Style (17th ed.) CitationAmbler, A. P., I. D. Dear, J. H. Dick, and C. Dislis. Test Economis and Design for Testability for Electronic Circuits and Systems. New York: Ellis Horwood Ltd, 1995.
MLA (8th ed.) CitationAmbler, A. P., et al. Test Economis and Design for Testability for Electronic Circuits and Systems. Ellis Horwood Ltd, 1995.
Warning: These citations may not always be 100% accurate.
