Test Economis and design for testability for electronic circuits and systems

• Main Authors: Ambler, A. P. (Author), Dear, I. D. (Author), Dick, J. H. (Author), Dislis, C. (Author)
• Format: Book
• Language: English
• Published: New York Ellis Horwood Ltd c1995
• Subjects: ELECTRONIC CIRCUITS; Έλεγχος; Δοκιμές; ΕΠΕΑΕΚ