APA (7th ed.) Citation

Beenker, F. P., Bennets, R. G., & Thijssen, A. P. (1995). Testability concepts for digital ICs: The Macrotest approach. Kluwer Academic Publishers.

Chicago Style (17th ed.) Citation

Beenker, F. P., R. G. Bennets, and A. P. Thijssen. Testability Concepts for Digital ICs: The Macrotest Approach. Dordrecht: Kluwer Academic Publishers, 1995.

MLA (8th ed.) Citation

Beenker, F. P., et al. Testability Concepts for Digital ICs: The Macrotest Approach. Kluwer Academic Publishers, 1995.