Testability concepts for digital ICs The Macrotest approach

• Main Authors: Beenker, F. P. (Author), Bennets, R. G. (Author), Thijssen, A. P. (Author)
• Format: Book
• Language: English
• Published: Dordrecht Kluwer Academic Publishers c1995
• Subjects: Έλεγχος; Δοκιμές; ΕΠΕΑΕΚ