Defect Oriented Testing for CMOS Analog and Digital Circuits

• Main Author: Sachdev, Manoj (Author)
• Format: Book
• Language: English
• Published: Boston Kluwer Academic Publishers c1998
• Series: Frontiers in Electronic Testing / Vishwani D. Agrawal
• Subjects: Αναλογικά ολοκληρωμένα κυκλώματα; CIRCUIT DESIGN; CMOS; DIGITAL CIRCUITS; ΕΠΕΑΕΚ
• Item Description: includes bibl. references
• Physical Description: xiv,308p. fig.
• ISBN: 0 7923 8083 5