Defect Oriented Testing for CMOS Analog and Digital Circuits

Defect Oriented Testing for CMOS Analog and Digital Circuits

Bibliographic Details
Main Author: Sachdev, Manoj (Author)
Format: Book
Language:English
Published: Boston Kluwer Academic Publishers c1998
Series:Frontiers in Electronic Testing / Vishwani D. Agrawal
Subjects:
Αναλογικά ολοκληρωμένα κυκλώματα
CIRCUIT DESIGN
CMOS
DIGITAL CIRCUITS
ΕΠΕΑΕΚ

ΒΚΠ - Πατρα: ALFf

Holdings details from ΒΚΠ - Πατρα: ALFf
Call Number: 621.395 SAC
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