Random Testing of Digital Circuits Theory and Applications

Random Testing of Digital Circuits Theory and Applications

Bibliographic Details
Main Author: David, Rene (Author)
Format: Book
Language:English
Published: New York Marcel Dekker Inc. c1998
Subjects:
DIGITAL INTEGRATED CIRCUITS
INTEGRATED CIRCUITS
Δοκιμές
ΕΠΕΑΕΚ

ΒΚΠ - Πατρα: ALFf

Holdings details from ΒΚΠ - Πατρα: ALFf
Call Number: 621.381 5 DAV
Copy 1 Available

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