From contamination to defects, foults and yield loss Simulation and applications

• Main Authors: Khare, Jitendra B. (Author), Maly, Wojciech (Author)
• Format: Book
• Language: English
• Published: Bostn Kluwer Academic Publishers c1996
• Subjects: CODEF; Βιομηχανοποίηση; Δοκιμές; ΕΠΕΑΕΚ
• Item Description: ΕΠΕΑΕΚ/ΙΤΥ
• Physical Description: 150p. fig.
• ISBN: 0 7923 9714 2