From contamination to defects, foults and yield loss Simulation and applications

From contamination to defects, foults and yield loss Simulation and applications

Bibliographic Details
Main Authors: Khare, Jitendra B. (Author), Maly, Wojciech (Author)
Format: Book
Language:English
Published: Bostn Kluwer Academic Publishers c1996
Subjects:
CODEF
Βιομηχανοποίηση
Δοκιμές
ΕΠΕΑΕΚ

Μηχανικών Η/Υ και Πληροφορικής: Unknown

Holdings details from Μηχανικών Η/Υ και Πληροφορικής: Unknown
Call Number: 658.56 KHA
Copy 1 Available

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