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LEADER |
00945nam a2200265 u 4500 |
001 |
10105489 |
003 |
upatras |
005 |
20210117204159.0 |
008 |
991223s1997 f eng |
020 |
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|a 0 12 434330 9
|
040 |
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|a Βιβλιοθήκη ΙΤΥ
|c Βιβλιοθήκη ΙΤΥ
|
040 |
|
|
|a XX-XxUND
|c Βιβλιοθήκη ΙΤΥ
|
082 |
1 |
4 |
|a 621.395
|2 20th ed.
|
245 |
1 |
0 |
|a Digital circuit testing and testability
|c Parag K. Lala, auth.
|
260 |
|
|
|a San Diego
|b Academic Press
|c 1997
|
300 |
|
|
|a xii,199p.:fig.
|
650 |
|
4 |
|a ΕΠΕΑΕΚ
|9 116438
|
650 |
|
4 |
|a INTEGRATED CIRCUITS
|9 24300
|
650 |
|
4 |
|a VLSI
|9 24366
|
650 |
|
4 |
|a DIGITAL INTEGRATED CIRCUITS
|9 124354
|
700 |
1 |
|
|a Lala, Parag K.
|9 116564
|
852 |
|
|
|a GR-PaULI
|b ΠΑΤΡΑ
|b ΤΜΗΥΠ
|h 621.395 LAL
|t 1
|
942 |
|
|
|2 ddc
|
952 |
|
|
|0 0
|1 0
|4 0
|6 621_395000000000000_LAL
|7 0
|9 137631
|a CEID
|b CEID
|d 2016-04-24
|l 0
|o 621.395 LAL
|r 2016-04-24 00:00:00
|t 1
|w 2016-04-24
|
999 |
|
|
|c 90078
|d 90078
|