APA (7th ed.) Citation

(1996). Test and design validity: Proceedings. International Test Conference, october 20-25, 1996 Washington D.C. USA. IEEE.

Chicago Style (17th ed.) Citation

Test and Design Validity: Proceedings. International Test Conference, October 20-25, 1996 Washington D.C. USA. IEEE, 1996.

MLA (8th ed.) Citation

Test and Design Validity: Proceedings. International Test Conference, October 20-25, 1996 Washington D.C. USA. IEEE, 1996.

Warning: These citations may not always be 100% accurate.