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|a Βιβλιοθηκη ΙΤΥ
|c Βιβλιοθηκη ΙΤΥ
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040 |
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|a XX-XxUND
|c Βιβλιοθηκη ΙΤΥ
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245 |
1 |
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|a Test and design validity
|b Proceedings. International Test Conference, october 20-25, 1996 Washington D.C. USA
|
260 |
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|b IEEE
|c 1996
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650 |
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|a Δοκιμές
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|b ΠΑΤΡΑ
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