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Test and design validity
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Test and design validity Proceedings. International Test Conference, october 20-25, 1996 Washington D.C. USA
Bibliographic Details
Format:
Book
Language:
Greek
Published:
IEEE
1996
Subjects:
Δοκιμές
Holdings
Description
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Μηχανικών Η/Υ και Πληροφορικής: Unknown
Holdings details from Μηχανικών Η/Υ και Πληροφορικής: Unknown
Call Number:
621.381 548
Copy 1
Available
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