Point defects in semiconductors II experimental aspects

Point defects in semiconductors II experimental aspects

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Bibliographic Details
Main Authors: Bourgoin, Jacques (Author), Lannoo, M. (Author)
Format: Book
Language:English
Published: Berlin Springer-Verlag 1983
Series:Springer series in solid state sciences 35
Subjects:
Ημιαγωγοί

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 537.622 6 BOU
Copy 1 Available

Φυσικό: Unknown

Holdings details from Φυσικό: Unknown
Call Number: 537.622 6 B
Copy 2 Available

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