VLSI test principles and architectures : design for testability /
| Other Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers,
c2006.
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| Series: | The Morgan Kaufmann series in systems on silicon
|
| Subjects: |
ΒΚΠ - Πατρα: BSC
| Call Number: |
621.395 VLS |
|---|---|
| Copy 1 | Available |
| Copy 2 | Available |
ΒΚΠ - Πατρα: ALFe
| Call Number: |
621.395 VLS |
|---|---|
| Copy 3 | Available |
| Copy 4 | Available |
| Copy 6 | Available |
| Copy 7 | Available |
| Copy 8 | Available |
| Copy 9 | Available |
| Copy 10 | Available |
| Copy 5 | Available |
| Copy 12 | Available |
| Copy 11 | Available |
