Matching Properties of Deep Sub-Micron MOS Transistors

• Main Authors: Croon, Jeroen A. (Author), Sansen, Willy (Author), Maes, Herman E. (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2005.
• Series: The Kluwer International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, 851
• Subjects: Engineering.; Physics.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Physics, general.; Electronics and Microelectronics, Instrumentation.; Engineering, general.; Electrical Engineering.

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermor...