Matching Properties of Deep Sub-Micron MOS Transistors

Matching Properties of Deep Sub-Micron MOS Transistors

Εμφάνιση άλλων εκδόσεων (1)

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermor...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Croon, Jeroen A. (Συγγραφέας), Sansen, Willy (Συγγραφέας), Maes, Herman E. (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2005.
Σειρά:	The Kluwer International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, 851
Θέματα:	Engineering. Physics. Electrical engineering. Electronics. Microelectronics. Electronic circuits. Circuits and Systems. Physics, general. Electronics and Microelectronics, Instrumentation. Engineering, general. Electrical Engineering.
Διαθέσιμο Online:	Full Text via HEAL-Link

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