Matching Properties of Deep Sub-Micron MOS Transistors

• Κύριοι συγγραφείς: Croon, Jeroen A. (Συγγραφέας), Sansen, Willy (Συγγραφέας), Maes, Herman E. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2005.
• Σειρά: The Kluwer International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, 851
• Θέματα: Engineering.; Physics.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Physics, general.; Electronics and Microelectronics, Instrumentation.; Engineering, general.; Electrical Engineering.

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermor...

Πίνακας περιεχομένων:

• Introduction: Matching analysis. Importance for circuit design. State of the art. Research objectives. Outline of this book
• Measurement and Modeling of Mismatch. Measurement setup. Experimental setup. Modeling of mismatch in the drain current. Width and length dependence. Example: Yield of a current-steering D/A converter. Conclusions
• Parameter Extraction. Extraction methods. Experimental setup. Comparison of extraction methods. Future issues. Conclusions
• Physical Origins of Mosfet Mismatch. Basic operation of the MOS transistor. Mismatch in the drain current. Physical origins of fluctuations. Conclusions
• Technological Aspects. Technology descriptions. Impact of the gate. Impact of the halo implantation. Comparison of di®erent CMOS technologies. Alternative device concepts. Conclusions
• Impact of Line-Edge Roughness. Characterization of line-edge roughness. Modeling the impact of line-width roughness. Experimental investigation of the impact of LWR. Prediction of the impact of LWR and guidelines. Conclusions
• Conclusions, Future Work and Outlook. Conclusions. Future work
• Outlook.