Introduction to Advanced System-on-Chip Test Design and Optimization

• Κύριος συγγραφέας: Larsson, Erik (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2005.
• Σειρά: Frontiers in Electronic Testing, 29
• Θέματα: Engineering.; Engineering design.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Optical materials.; Electronic materials.; Circuits and Systems.; Electrical Engineering.; Electronics and Microelectronics, Instrumentation.; Engineering Design.; Optical and Electronic Materials.

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automat...