Introduction to Advanced System-on-Chip Test Design and Optimization

• Κύριος συγγραφέας: Larsson, Erik (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2005.
• Σειρά: Frontiers in Electronic Testing, 29
• Θέματα: Engineering.; Engineering design.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Optical materials.; Electronic materials.; Circuits and Systems.; Electrical Engineering.; Electronics and Microelectronics, Instrumentation.; Engineering Design.; Optical and Electronic Materials.

SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automat...

Πίνακας περιεχομένων:

• Testing Concepts
• Design Flow
• Design for Test
• Boundary Scan
• SOC Design for Testability
• System Modeling
• Test Conflicts
• Test Power Dissipation
• Test Access Mechanism
• Test Scheduling
• SOC Test Applications
• A Reconfigurable Power-Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling
• An Integrated Framework for the Design and Optimization of SOC Test Solutions
• Efficient Test Solutions for Core-Based Designs
• Core Selection in the SOC Test Design-Flow
• Defect-Aware Test Scheduling
• An Integrated Technique for Test Vector Selection and Test Scheduling under ATE Memory Depth Constraint.