Fault Diagnosis of Analog Integrated Circuits

• Κύριοι συγγραφείς: Kabisatpathy, Prithviraj (Συγγραφέας), Barua, Alok (Συγγραφέας), Sinha, Satyabroto (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2005.
• Σειρά: Frontiers in Electronic Testing, 30
• Θέματα: Engineering.; Engineering design.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Engineering Design.; Electronics and Microelectronics, Instrumentation.; Electrical Engineering.

System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast,...