Fault Diagnosis of Analog Integrated Circuits

Fault Diagnosis of Analog Integrated Circuits

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System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast,...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Kabisatpathy, Prithviraj (Συγγραφέας), Barua, Alok (Συγγραφέας), Sinha, Satyabroto (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2005.
Σειρά:	Frontiers in Electronic Testing, 30
Θέματα:	Engineering. Engineering design. Electrical engineering. Electronics. Microelectronics. Electronic circuits. Circuits and Systems. Engineering Design. Electronics and Microelectronics, Instrumentation. Electrical Engineering.
Διαθέσιμο Online:	Full Text via HEAL-Link

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