Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /

Show other versions (2)

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction...

Full description

Bibliographic Details
Main Author: Egerton, Ray F. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Boston, MA : Springer US : Imprint: Springer, 2005.
Subjects:
Materials science.
Microscopy.
Nanotechnology.
Materials Science.
Characterization and Evaluation of Materials.
Biological Microscopy.
Online Access:Full Text via HEAL-Link

Internet

Full Text via HEAL-Link

ΒΚΠ - Πατρα: ALFd

Holdings details from ΒΚΠ - Πατρα: ALFd
Call Number: 330.01 BAU
Copy 1 Available

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 330.01 BAU
Copy 2 Available
Copy 3 Available

Similar Items