Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Kalinin, Sergei (Editor), Gruverman, Alexei (Editor)
• Format: Electronic eBook
• Language: English
• Published: New York, NY : Springer New York, 2007.
• Subjects: Materials science.; Microscopy.; Solid state physics.; Mechanical engineering.; Nanotechnology.; Materials > Surfaces.; Thin films.; Materials Science.; Characterization and Evaluation of Materials.; Surfaces and Interfaces, Thin Films.; Biological Microscopy.; Mechanical Engineering.; Solid State Physics.

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fund...