Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Kalinin, Sergei (Επιμελητής έκδοσης), Gruverman, Alexei (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2007.
• Θέματα: Materials science.; Microscopy.; Solid state physics.; Mechanical engineering.; Nanotechnology.; Materials > Surfaces.; Thin films.; Materials Science.; Characterization and Evaluation of Materials.; Surfaces and Interfaces, Thin Films.; Biological Microscopy.; Mechanical Engineering.; Solid State Physics.

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fund...