Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Kalinin, Sergei (Επιμελητής έκδοσης), Gruverman, Alexei (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: New York, NY : Springer New York, 2007.
• Θέματα: Materials science.; Microscopy.; Solid state physics.; Mechanical engineering.; Nanotechnology.; Materials > Surfaces.; Thin films.; Materials Science.; Characterization and Evaluation of Materials.; Surfaces and Interfaces, Thin Films.; Biological Microscopy.; Mechanical Engineering.; Solid State Physics.

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fund...

Πίνακας περιεχομένων:

• SPM Techniques for Electrical Characterization
• Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport
• Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy
• Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
• Principles of Kelvin Probe Force Microscopy
• Frequency-Dependent Transport Imaging by Scanning Probe Microscopy
• Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy
• Principles of Near-Field Microwave Microscopy
• Electromagnetic Singularities and Resonances in Near-Field Optical Probes
• Electrochemical SPM
• Near-Field High-Frequency Probing
• Electrical and Electromechanical Imaging at the Limits of Resolution
• Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors
• Spin-Polarized Scanning Tunneling Microscopy
• Scanning Probe Measurements of Electron Transport in Molecules
• Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices
• Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks
• Theory of Scanning Probe Microscopy
• Multi-Probe Scanning Tunneling Microscopy
• Dynamic Force Microscopy and Spectroscopy in Vacuum
• Scanning Tunneling Microscopy and Spectroscopy of Manganites
• Electrical SPM Characterization of Materials and Devices
• Scanning Voltage Microscopy
• Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces
• Electromechanical Behavior in Biological Systems at the Nanoscale
• Scanning Capacitance Microscopy
• Kelvin Probe Force Microscopy of Semiconductors
• Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy
• Electron Flow Through Molecular Structures
• Electrical Characterization of Perovskite Nanostructures by SPM
• SPM Measurements of Electric Properties of Organic Molecules
• High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices
• Electrical Nanofabrication
• Electrical SPM-Based Nanofabrication Techniques
• Fundamental Science and Lithographic Applications of Scanning Probe Oxidation
• UHV-STM Nanofabrication on Silicon
• Ferroelectric Lithography
• Patterned Self-Assembled Monolayers via Scanning Probe Lithography
• Resistive Probe Storage: Read/Write Mechanism.