Fault-Tolerance Techniques for SRAM-based FPGAs

• Κύριοι συγγραφείς: Kastensmidt, Fernanda Lima (Συγγραφέας), Carro, Luigi (Συγγραφέας), Reis, Ricardo (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2006.
• Θέματα: Engineering.; Logic design.; Computer software > Reusability.; Engineering design.; Electrical engineering.; Electronics.; Microelectronics.; Optical materials.; Electronic materials.; Electrical Engineering.; Optical and Electronic Materials.; Electronics and Microelectronics, Instrumentation.; Engineering Design.; Performance and Reliability.; Logic Design.

Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technol...