Fault-Tolerance Techniques for SRAM-based FPGAs

Fault-Tolerance Techniques for SRAM-based FPGAs

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Fault-tolerance in integrated circuits is not an exclusive concern regarding space designers or highly-reliable application engineers. Rather, designers of next generation products must cope with reduced margin noises due to technological advances. The continuous evolution of the fabrication technol...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Kastensmidt, Fernanda Lima (Συγγραφέας), Carro, Luigi (Συγγραφέας), Reis, Ricardo (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή:	SpringerLink (Online service)
Μορφή:	Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:	English
Έκδοση:	Boston, MA : Springer US, 2006.
Θέματα:	Engineering. Logic design. Computer software > Reusability. Engineering design. Electrical engineering. Electronics. Microelectronics. Optical materials. Electronic materials. Electrical Engineering. Optical and Electronic Materials. Electronics and Microelectronics, Instrumentation. Engineering Design. Performance and Reliability. Logic Design.
Διαθέσιμο Online:	Full Text via HEAL-Link

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