Emerging Nanotechnologies Test, Defect Tolerance, and Reliability /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Tehranipoor, Mohammad (Editor)
• Format: Electronic eBook
• Language: English
• Published: Boston, MA : Springer US, 2008.
• Series: Frontiers in Electronic Testing, 37
• Subjects: Engineering.; Quality control.; Reliability.; Industrial safety.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Nanotechnology.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.; Quality Control, Reliability, Safety and Risk.; Electrical Engineering.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies of...