Emerging Nanotechnologies Test, Defect Tolerance, and Reliability /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Tehranipoor, Mohammad (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Boston, MA : Springer US, 2008.
• Σειρά: Frontiers in Electronic Testing, 37
• Θέματα: Engineering.; Quality control.; Reliability.; Industrial safety.; Electrical engineering.; Electronics.; Microelectronics.; Electronic circuits.; Nanotechnology.; Circuits and Systems.; Electronics and Microelectronics, Instrumentation.; Quality Control, Reliability, Safety and Risk.; Electrical Engineering.

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies of...