Emerging Nanotechnologies Test, Defect Tolerance, and Reliability /

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies of...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Tehranipoor, Mohammad (Editor)
Format: Electronic eBook
Language:English
Published: Boston, MA : Springer US, 2008.
Series:Frontiers in Electronic Testing, 37
Subjects:
Online Access:Full Text via HEAL-Link
Table of Contents:
  • Test and Defect Tolerance for Crossbar-Based Architectures
  • Defect-Tolerant Logic with Nanoscale Crossbar Circuits
  • Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabrics
  • Test and Defect Tolerance for Reconfigurable Nanoscale Devices
  • A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnology
  • Defect Tolerance in Crossbar Array Nano-Architectures
  • Test and Defect Tolerance for QCA Circuits
  • Reversible and Testable Circuits for Molecular QCA Design
  • Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems
  • QCA Circuits for Robust Coplanar Crossing
  • Reliability and Defect Tolerance in Metallic Quantum-Dot Cellular Automata
  • Testing Microfluidic Biochips
  • Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems
  • Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
  • Reliability for Nanotechnology Devices
  • Designing Nanoscale Logic Circuits Based on Principles of Markov Random Fields
  • Towards Nanoelectronics Processor Architectures
  • Design and Analysis of Fault-Tolerant Molecular Computing Systems.